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Consider two sources of sound, that may or may not be in phase, emitting waves at a single frequency, and consider the frequencies to be the same.
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Related Experiment Video

Updated: Apr 30, 2026

Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator
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Two-shot common-path phase-shifting interferometer with a four-step algorithm and an unknown phase shift.

Zhi Zhong, Bengong Hao, Mingguang Shan

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    Summary
    This summary is machine-generated.

    This study introduces a novel two-shot common-path interferometer for phase measurement. The system uses a Ronchi grating and polarizers to achieve accurate phase retrieval without knowing the exact phase shift.

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    Area of Science:

    • Optical Engineering
    • Interferometry
    • Phase Measurement

    Background:

    • Common-path interferometers offer stability against environmental disturbances.
    • Phase-shifting interferometry is a key technique for precise optical metrology.

    Purpose of the Study:

    • To develop a simplified two-shot common-path phase-shifting interferometer.
    • To enable accurate phase retrieval of specimens with minimal system knowledge.

    Main Methods:

    • Utilizes a 4f optical system with a Ronchi grating in the Fourier plane.
    • Generates adjacent interferograms using specific diffraction orders (0, +1 and 0, -1).
    • Employs two linear polarizers and grating translation to acquire four phase-shifted interferograms in two shots.

    Main Results:

    • Successfully retrieves specimen phase using an algorithm similar to standard four-step methods.
    • Demonstrates phase retrieval without prior knowledge of the grating-induced phase shift.
    • Confirms method validity and repeatability through simulations and experimental validation.

    Conclusions:

    • The proposed two-shot common-path interferometer is a robust and efficient method for phase measurement.
    • This technique simplifies phase retrieval by eliminating the need to calibrate unknown phase shifts.
    • The system shows potential for various optical metrology applications requiring high precision.