Phase Contrast and Differential Interference Contrast Microscopy
X-ray Imaging
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
We developed a sparse phase-stepping (SPS) method for x-ray Talbot-Lau interferometry. This technique reduces image acquisition while maintaining high spatial resolution, proving effective in practical applications.
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