An automated and fast approach to detect single-trial visual evoked potentials with application to brain-computer

Yiheng Tu1, Yeung Sam Hung1, Li Hu2

  • 1Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong, China.

Summary

This study introduces an automated method for detecting single-trial visual evoked potentials (VEPs), enhancing brain-computer interface (BCI) performance. The approach significantly improves accuracy and enables real-time BCI applications.

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