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EELS tomography in multiferroic nanocomposites: from spectrum images to the spectrum volume
Lluís Yedra1, Alberto Eljarrat, José Manuel Rebled
1Laboratory of Electron Nanoscopies (LENS)-MIND/IN2UB, Dept. d'Electrònica, Universitat de Barcelona, C/Martí i Franquès 1, 08028 Barcelona, Spain. llyedra@el.ub.edu.
Abstract:
Electron Energy Loss Spectroscopy (EELS) in a transmission electron microscope offers the possibility of extracting high accuracy maps of composition and electronic properties through EELS spectrum images (EELS-SI). Acquiring EELS-SI for different tilt angles, a 3D tomographic reconstruction of EELS information can be achieved. In the present work we show that an EELS spectrum volume (EELS-SV), a 4D dataset where every voxel contains a full EELS spectrum, can be reconstructed from the EELS-SI tilt series by the application of multivariate analysis. We apply this novel approach to characterize a nanocomposite material consisting of CoFe2O4 nanocolumns embedded in a BiFeO3 matrix grown on a LaNiO3 buffered LaAlO3 (001) substrate.
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