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[High accuracy sample positioning system for hard X-ray microprobe].

Ji-Chao Zhang, Dong-Xu Liang, Yan He

    Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu
    |May 15, 2014
    PubMed
    Summary

    A new offline positioning system for hard X-ray micro-focus beamlines enables micron-scale precision. This system accurately locates samples for material micro-characterization using synchrotron radiation.

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    Area of Science:

    • Materials Science
    • Synchrotron Radiation Physics
    • Nanotechnology

    Context:

    • Hard X-ray micro-focus beamlines are crucial for materials characterization.
    • Accurate sample positioning is essential for micro-scale investigations.
    • Current methods may lack the precision required for advanced studies.

    Purpose:

    • To develop and validate a novel offline sample positioning system for hard X-ray micro-focus beamlines.
    • To integrate offline microscopic examination with online X-ray fluorescence imaging.
    • To achieve micron-scale positioning accuracy for sample manipulation.

    Summary:

    • A three-part system comprising an offline microscope, online experiment setup, and precision holder was developed for the BL15U1 beamline at SSRF.
    • The system combines offline microscopic examination and online X-ray fluorescence imaging through coordinate conversion.
    • Accuracy was verified using a gold mesh, showing average errors of 1.3 µm (X-axis) and 2.5 µm (Z-axis).

    Impact:

    • Enables rapid and accurate identification of micro-zones for material study.
    • Represents a first in domestic synchrotron facilities for micron-scale offline sample positioning.
    • Provides technical foundation for automated sample focusing in hard X-ray micro-focus beamlines.