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Reflectivity enhancement in titanium by ultrafast XUV irradiation
F Bencivenga1, E Principi1, E Giangrisostomi2
1Elettra-Sincrotrone Trieste S.C.p.A., S.S. 14 km 163, 5 in AREA Science Park, I-34149 Basovizza, Italy.
Scientific Reports
|May 15, 2014
Summary
Researchers used extreme ultraviolet (XUV) reflectivity to measure free electron density in highly photo-excited titanium (Ti) samples. This method aids in understanding matter under extreme conditions using free-electron-laser (FEL) technology.
Area of Science:
- Condensed matter physics
- Plasma physics
- Laser-matter interactions
Background:
- The study of highly photo-excited matter at solid-state density is an emerging research area.
- Advancements in free-electron-laser (FEL) technology are driving progress in this field.
Purpose of the Study:
- To investigate the properties of highly photo-excited matter using XUV reflectivity.
- To establish a simple experimental method for determining free electron density and ionization states.
Main Methods:
- Irradiating a titanium (Ti) sample with ultrafast seeded FEL pulses.
- Conducting XUV reflectivity experiments at variable incident photon fluence and frequency.
- Applying Drude formalism to analyze reflectivity changes.
Main Results:
- Observed an increase in reflectivity with increasing excitation fluence.
- Related reflectivity increase to plasma frequency and free electron density.
- Estimated free electron density in the excited Ti sample.
Conclusions:
- The experimental approach is simple and effective for measuring free electron density.
- This method can serve as a complementary tool for determining the average ionization state.
- Provides insights into the physics of matter under extreme conditions.
