Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.1K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.1K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Probing the Nanoscale Onset of Plasticity in Electroplated Copper for Hybrid Bonding Structures via Multimodal Atomic Force Microscopy.

ACS applied nano materials·2025
Same author

Tracking and Characterizing Spatiotemporal and Three-Dimensional Locomotive Behaviors of Individual Broilers in the Three-Point Gait-Scoring System.

Animals : an open access journal from MDPI·2023
Same author

Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy.

ACS applied materials & interfaces·2022
Same author

The effect of edge compliance on the contact between a spherical indenter and a high-aspect-ratio rectangular fin.

Experimental mechanics·2022
Same author

Perches as Cooling Devices for Reducing Heat Stress in Caged Laying Hens: A Review.

Animals : an open access journal from MDPI·2021
Same author

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode.

Beilstein journal of nanotechnology·2021
Same journal

Ultra-Sensitive UV Photodetectors Enabled by Built-in Electric Fields in Hierarchical NP-Type Porous Silicon.

Nanotechnology·2026
Same journal

Effect of sintering temperature on structural, microstructural and magnetic properties of La<sub>0.8</sub>Sr<sub>0.2</sub>MnO<sub>3</sub>: Evolution of faceting and terrace like morphology.

Nanotechnology·2026
Same journal

Engineered V2C MXene Anchored Cu Nanoparticles for Selective Nitrate/Nitrite Sensing and Magneto-Electrocatalytic Hydrogen Evolution Reaction.

Nanotechnology·2026
Same journal

Quantitative Mechanism Separation of Single-Event Transients in Nanosheet Transistors via TCAD Simulation.

Nanotechnology·2026
Same journal

Antibacterial, mechanical and curing properties of PMMA bone cement loaded with copper nanoparticles.

Nanotechnology·2026
Same journal

Deep learning-enabled self-powered bimodal flexible sensor for intelligent access control.

Nanotechnology·2026
See all related articles

Related Experiment Video

Updated: Apr 29, 2026

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy
10:06

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy

Published on: July 10, 2019

6.8K

Intermittent contact resonance atomic force microscopy.

Gheorghe Stan1, Richard S Gates

  • 1Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.

Nanotechnology
|May 27, 2014
PubMed
Summary
This summary is machine-generated.

A new intermittent contact resonance atomic force microscopy (ICR-AFM) method quantifies material properties. This technique precisely measures elastic moduli and adhesion on polymer films by analyzing cantilever resonance during controlled surface contact.

More Related Videos

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

20.8K
Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

11.2K

Related Experiment Videos

Last Updated: Apr 29, 2026

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy
10:06

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy

Published on: July 10, 2019

6.8K
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

20.8K
Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

11.2K

Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Atomic Force Microscopy (AFM) is crucial for nanoscale material characterization.
  • Existing AFM modes have limitations in quantitative mechanical property measurement.
  • Frequency modulation techniques offer enhanced sensitivity for probing material interactions.

Purpose of the Study:

  • To introduce and validate a novel AFM mode: intermittent contact resonance atomic force microscopy (ICR-AFM).
  • To enable high-resolution quantitative characterization of material elastic moduli and adhesive properties.
  • To demonstrate the technique's efficacy on a challenging two-phase polymer system.

Main Methods:

  • Developed and implemented the ICR-AFM technique, a frequency modulation method.
  • Utilized scanning force-controlled AFM modes (force volume, peak force tapping).
  • Performed high-speed data capture to record cantilever resonance frequency changes during intermittent surface contact and analyzed stiffness-force curves.

Main Results:

  • Successfully obtained detailed contact stiffness-force curves on a polystyrene/poly(methyl methacrylate) film.
  • Achieved quantitative characterization of sub-micrometer domains within the polymer film.
  • Demonstrated improved accuracy in determining elastic moduli and adhesive properties through normalized linear fits.

Conclusions:

  • ICR-AFM provides a robust method for quantitative nanoscale mechanical property assessment.
  • The technique offers significant advantages for characterizing heterogeneous materials like polymer blends.
  • ICR-AFM advances the capabilities of atomic force microscopy for materials research.