Study of solid-conversion gaseous detector based on GEM for high energy X-ray industrial CT

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

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Rifeng Zhou1, Yaling Zhou1

  • 1ICT Research Center, The Key Lab. for Opto-electronic Technology and Systems of Ministry of Education, University of Chongqing, Chongqing, China.

Journal of X-Ray Science and Technology
|May 29, 2014
PubMed

Keywords:
GEMHigh energy X-raygaseous detectorsindustrial computer tomography

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