Transport properties of a 3D topological insulator based on a strained high-mobility HgTe film

D A Kozlov1, Z D Kvon1, E B Olshanetsky2

  • 1A. V. Rzhanov Institute of Semiconductor Physics, Novosibirsk 630090, Russia and Novosibirsk State University, Novosibirsk 630090, Russia.