Structure evolution of poly(3-hexylthiophene) on Si wafer and poly(vinylphenol) sublayer

The structure evolution of P3HT thin films on Si wafer and PVPh covered Si wafer during heating, thermal annealing, and melt recrystallization processes has been studied in detail using X-ray analysis techniques. The effect of substrate on the crystallization behavior and interface structure of P3HT films was explored. For the P3HT films deposited on the Si substrate, it was found that the stability of P3HT crystals is orientation dependent. The crystals oriented with b-axis normal to the substrate, that is, a face-on molecular orientation, are less stable than those with the a-axis arranged normal to the substrate (side-on molecular orientation). Thermal annealing temperature plays an important role in the molecular structure of P3HT including crystal structure, film thickness, and surface roughness. After annealing at relatively high temperature, new crystals form during the cooling process accompanied by the shrinking of a-axis. Moreover, the melt recrystallization favors the formation of more stable P3HT crystals with side-on molecular orientation. The PVPh substrate does not affect the crystallization behavior of solution cast P3HT significantly but inhibits the formation of P3HT crystal with face-on molecular orientation. However, the interfacial morphology of P3HT and PVPh changes by annealing at elevated temperature. The P3HT/PVPh interface changes from a sharply defined one into a diffused one at around 160 °C. The PVPh sublayer inhibits the melt recrystallization of P3HT to some extent, leading to a slight expansion of the a-axis.