Jove
Visualize
Contact Us

Related Concept Videos

Focusing of Light in the Eye01:16

Focusing of Light in the Eye

6.1K
Light rays enter the eye through the cornea, a transparent dome-shaped tissue that is the eye's outermost layer. The cornea bends or refracts, light rays traveling to the pupil. The shape of the cornea determines how much of the light is bent and whether the image will be focused correctly on the retina at the back of the eye. Once the light has passed through both refraction layers, it converges into a single focal point onto a small area. This is where photoreceptors start transforming...
6.1K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Aggregates and Excitons: Excited-State Behavior of Platinum-Acetylide Two-Photon Chromophore-Doped Ormosil Glasses.

The journal of physical chemistry. A·2025
Same author

White light thermoplasmonic activated gold nanorod arrays enable the photo-thermal disinfection of medical tools from bacterial contamination.

Journal of materials chemistry. B·2023
Same author

Nonlinear optical properties and carrier recombination lifetime of GaN.

Applied optics·2023
Same author

Efficient second harmonic generation of a high-power picosecond CO<sub>2</sub> laser.

Optics letters·2022
Same author

United States Air Force Research Laboratory: introduction to the focus issue.

Applied optics·2021
Same author

Triplet state structure-property relationships in a series of platinum acetylides: effect of chromophore length and end cap electronic properties.

Physical chemistry chemical physics : PCCP·2019
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Apr 28, 2026

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
08:23

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings

Published on: September 30, 2019

5.5K

Measuring refractive index using the focal displacement method.

Joel M Murray, Jean Wei, Jacob O Barnes

    Applied Optics
    |June 13, 2014
    PubMed
    Summary

    A new, simple method accurately measures the refractive index of millimeter-thick semiconductor samples. This technique provides reliable optical data for established and novel ternary alloys at infrared wavelengths.

    More Related Videos

    Synthesis and Operation of Fluorescent-core Microcavities for Refractometric Sensing
    08:12

    Synthesis and Operation of Fluorescent-core Microcavities for Refractometric Sensing

    Published on: March 13, 2013

    12.2K
    Implementation of a Reference Interferometer for Nanodetection
    16:11

    Implementation of a Reference Interferometer for Nanodetection

    Published on: April 26, 2014

    8.8K

    Related Experiment Videos

    Last Updated: Apr 28, 2026

    A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
    08:23

    A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings

    Published on: September 30, 2019

    5.5K
    Synthesis and Operation of Fluorescent-core Microcavities for Refractometric Sensing
    08:12

    Synthesis and Operation of Fluorescent-core Microcavities for Refractometric Sensing

    Published on: March 13, 2013

    12.2K
    Implementation of a Reference Interferometer for Nanodetection
    16:11

    Implementation of a Reference Interferometer for Nanodetection

    Published on: April 26, 2014

    8.8K

    Area of Science:

    • Materials Science
    • Optics
    • Solid State Physics

    Background:

    • Accurate refractive index (RI) is crucial for semiconductor device design.
    • Existing methods can be complex or unsuitable for thin, plane-parallel samples.

    Purpose of the Study:

    • Introduce a straightforward technique for measuring the RI of millimeter-thick plane-parallel semiconductor samples.
    • Determine and report RI values at specific infrared wavelengths.

    Main Methods:

    • A simple measurement technique was developed for plane-parallel samples.
    • Refractive index measurements were performed at two infrared wavelengths.

    Main Results:

    • The RI values for four bulk semiconductors closely matched existing literature data (within a few percent).
    • Novel RI values were determined for newly grown ternary alloys: Cadmium Magnesium Telluride (CdMgTe) and Cadmium Manganese Telluride (CdMnTe).
    • These RI values for CdMgTe and CdMnTe were previously unreported at the studied infrared wavelengths.

    Conclusions:

    • The developed technique is effective for measuring the refractive index of thin semiconductor samples.
    • The study provides new optical data for ternary semiconductor alloys, valuable for future research and applications.