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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

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Optical signal to noise ratio improvement through unbalanced noise beating in phase-sensitive parametric amplifiers

R Malik, A Kumpera, S L I Olsson

    Optics Express
    |June 13, 2014
    PubMed

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