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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Comparative analysis on viewing angle change in Fresnel and Fourier holographic images reconstructed by a tilted
Abstract:
We carry out a comparative analysis on a viewing angle change in Fresnel and Fourier holographic images reconstructed by a tilted plane wave. A tilted plane wave illuminating an on-axis hologram generates a diffractive wave carrying the holographic image in a paraxial region of a new diffraction axis. The reconstructed image in the Fresnel hologram is deformed along the new viewing direction, which is well described as Affine transformation. In the Fourier holographic image, the replica of the image is formed without its deformation when the hologram is placed in the front focal plane of the lens, whereas in the case of a hologram that is located at a distance different from a focal length, image deformation arises. This property is investigated through numerical simulation based on a wide-angle diffraction phenomenon. We also perform a similar interpretation for high-order diffraction images appearing in the sampled Fourier hologram and discuss a method for enlarging the viewing angle of the holographic image.
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