Facile strain analysis of largely bending films by a surface-labelled grating method

Norihisa Akamatsu1, Wataru Tashiro1, Keisuke Saito1

  • 1Chemical Resources Laboratory, Tokyo Institute of Technology, R1-12, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan.

Scientific Reports
|June 21, 2014
PubMed
Summary

A new method using surface-labelled gratings accurately measures 2D surface strain in bending films. This tool reveals unique soft-matter mechanics, crucial for designing advanced flexible electronics and biointegrated devices.

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