Dual scanning and full-field hard x-ray microscopy with a laboratory source

Area of Science:

• X-ray optics
• Microscopy
• Materials science

Background:

• Standard laboratory X-ray sources often lack the coherence and flux required for high-resolution phase contrast imaging.
• Existing X-ray microscopy techniques may require specialized synchrotron sources, limiting accessibility.

Purpose of the Study:

• To experimentally demonstrate a hard X-ray microscopy scheme capable of both absorption and phase contrast imaging.
• To achieve high imaging resolution using a conventional laboratory X-ray source.

Main Methods:

• Development of an X-ray optical system utilizing two crossed planar waveguides coupled to a primary source.
• Implementation of both scanning and full-field imaging modes within the same experimental setup.
• Utilizing the dual waveguide as a secondary micron-sized source for enhanced resolution.

Main Results:

• Successful demonstration of hard X-ray microscopy with absorption and phase contrast capabilities.
• Achieved a spatial resolution of approximately 2 μm in scanning mode.
• Presented proof-of-concept imaging of thin metal grids and glass micro-spheres, including differential phase and retrieved phase depth.

Conclusions:

• The developed dual waveguide X-ray microscopy scheme effectively utilizes a standard laboratory source for high-resolution imaging.
• The technique offers a versatile platform for absorption and phase contrast imaging, applicable to various materials.