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Electronic Distance Measuring Instruments01:30

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Related Experiment Video

Updated: Apr 27, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

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Surface measurements by white light spatial-phase-shift imaging interferometry.

Yoel Arieli, Shlomi Epshtein, Igor Yakubov

    Optics Express
    |July 1, 2014
    PubMed
    Summary
    This summary is machine-generated.

    A new White Light Spatial-Phase-Shift (WLSPS) method enables object surface measurements from real images, not just direct object analysis. This common-path interferometry technique offers inherent vibration cancelation without a reference beam.

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    Area of Science:

    • Optics
    • Metrology
    • Surface Science

    Background:

    • Standard White Light Interferometry (WLI) requires a reference mirror for surface measurements.
    • Direct object analysis limits the application of interferometric techniques.
    • Vibration sensitivity is a common challenge in interferometric measurements.

    Purpose of the Study:

    • Introduce a novel common-path imaging interferometry method: White Light Spatial-Phase-Shift (WLSPS).
    • Demonstrate WLSPS's capability for object surface measurements using real object images.
    • Highlight the advantages of WLSPS over traditional WLI.

    Main Methods:

    • Interferometry is achieved through light wavefront manipulation reflected from the object's surface.
    • The method utilizes common-path imaging, eliminating the need for a separate reference mirror.
    • Surface measurements are performed on real images generated by an optical system.

    Main Results:

    • WLSPS allows surface measurements from any real object image, not requiring direct object access.
    • The technique integrates seamlessly with optical systems producing real images.
    • Inherent vibration cancelation is achieved due to the absence of a reference beam.

    Conclusions:

    • WLSPS offers a versatile and robust approach to object surface metrology.
    • The method enhances applicability by enabling measurements from images rather than direct object interaction.
    • WLSPS provides a vibration-resistant solution for surface measurement applications.