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    This study presents an efficient first-order scattering method for analyzing optical devices with defects. The approach significantly reduces computational cost for complex and periodic structures.

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    Area of Science:

    • Optics
    • Computational Electromagnetics
    • Materials Science

    Background:

    • Scattering analysis is crucial for optical device design.
    • Accurate simulation of inhomogeneous objects presents computational challenges.

    Purpose of the Study:

    • To develop an efficient first-order scattering method for analyzing slightly inhomogeneous objects.
    • To reduce the computational burden for simulating optical devices with defects.

    Main Methods:

    • Utilized a first-order approximation combined with the reciprocity theorem.
    • Calculated the scattered field by computing the field in a defectless structure at various incidence angles.
    • Validated numerical results against an exact calculation method.

    Main Results:

    • The proposed method efficiently handles complex structures with reduced computational cost.
    • Different defects can be analyzed without recomputing the entire field.
    • For periodic structures, computation is limited to a single period, decreasing time and memory requirements.

    Conclusions:

    • The developed method offers significant advantages for the engineering of optical devices.
    • It provides a computationally affordable way to analyze structures with defects.
    • This approach facilitates the design and optimization of advanced optical systems.