Trade-off between linewidth and slip rate in a mode-locked laser model

Area of Science:

• Quantum Optics
• Laser Physics
• Frequency Metrology

Background:

• Mode-locked lasers are crucial for precise frequency measurements.
• Controlling the carrier-envelope offset phase difference is key for laser stability.
• Understanding laser linewidth and lock-loss dynamics is vital for metrology applications.

Purpose of the Study:

• To investigate the relationship between linewidth and loss-of-lock rate in actively stabilized mode-locked lasers.
• To quantify the impact of lock loss on frequency measurement uncertainty.
• To model the laser dynamics using stochastic differential equations.

Main Methods:

• Active feedback control was used to stabilize the carrier-envelope offset phase difference.
• Stochastic differential equations, specifically diffusion processes, were employed to model laser dynamics.
• Large deviation theory was used to calculate the mean time to exit (lock loss rate).

Main Results:

• A direct trade-off was demonstrated between the laser linewidth and the rate of loss-of-lock.
• The linearized linewidth was compared to the lock loss rate derived from theoretical models.
• The study provides a quantitative understanding of how lock stability affects frequency measurement.

Conclusions:

• The trade-off between linewidth and lock loss rate is a fundamental limitation in mode-locked laser frequency metrology.
• The developed theoretical framework allows for better prediction and mitigation of frequency measurement errors.
• This research contributes to improving the accuracy and reliability of optical frequency standards.