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Comparison between transient and frequency modulated excitation: application to silicon nitride and aluminum oxide
1Helmholtz-Zentrum Berlin für Materialien und Energie, Institute Solar Fuels (E-IF), Hahn-Meitner-Platz 1, D-14109 Berlin, Germany.
The Review of Scientific Instruments
|July 3, 2014
Abstract:
Contactless measurements of the lifetime of charge carriers are presented with varying ways of photo excitation: with and without bias light and pulsed and frequency modulated. These methods are applied to the study of the surface passivation of single crystalline silicon by a-SiN(x):H and Al2O3 coatings. The properties of these coatings are investigated under consideration of the merits of the different methods.

