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High-performance nonvolatile organic transistor memory devices using the electrets of semiconducting blends
Yu-Cheng Chiu1, Tzu-Ying Chen, Yougen Chen
1Department of Chemical Engineering, National Taiwan University , Taipei 10617, Taiwan.
ACS Applied Materials & Interfaces
|July 8, 2014
Summary
Researchers developed organic nonvolatile transistor memory devices using N,N'-bis(2-phenylethyl)-perylene-3,4:9,10-tetracarboxylic diimide (BPE-PTCDI) and various electrets. Device performance, including write-once-read-many (WORM) and flash types, was tuned by altering electret composition and energy barriers.
Area of Science:
- Materials Science
- Organic Electronics
- Semiconductor Devices
Background:
- Organic nonvolatile transistor memory devices are crucial for next-generation electronics.
- Tuning memory characteristics requires precise control over semiconductor and electret materials.
- Understanding charge storage and transfer mechanisms is key to device optimization.
Purpose of the Study:
- To investigate the impact of different electret materials on the performance of organic nonvolatile transistor memory devices.
- To explore the relationship between electret composition, energy barriers, and memory characteristics (WORM vs. flash).
- To enhance the operational stability and cycle endurance of these memory devices.
Main Methods:
- Fabrication of organic nonvolatile transistor memory devices using N,N'-bis(2-phenylethyl)-perylene-3,4:9,10-tetracarboxylic diimide (BPE-PTCDI) as the n-type semiconductor.
- Utilization of various electret materials, including poly[4-(diphenylamino)benzyl methacrylate] (N(PTPMA)3) and its blends with PCBM, TIPS-pen, or ferrocene.
- Analysis of memory characteristics (WORM, flash, retention, cycle endurance) under different electret configurations and gate bias conditions.
- Insertion of a poly(methacrylic acid) (PMAA) layer to further improve device performance.
Main Results:
- The PCBM:N(PTPMA)3 blend electret demonstrated a transition from WORM to flash memory with increasing PCBM content, enabling repeatable operation via tunneling.
- Donor/donor electrets like TIPS-pen:N(PTPMA)3 and ferrocene:N(PTPMA)3 resulted in flash and WORM characteristics, respectively, attributed to interfacial energy barrier differences.
- All devices exhibited long data retention (>10(4) s) and stable read-out currents.
- Incorporating a PMAA layer significantly enhanced the write-read-erase-read (WRER) cycle endurance to 200 times.
Conclusions:
- The energy level and charge transfer dynamics within blend electrets significantly influence and allow tuning of nonvolatile transistor memory device characteristics.
- Interfacial energy barriers play a critical role in determining the memory behavior (WORM vs. flash).
- The strategic use of electret materials and layered structures offers a promising pathway for developing high-performance organic memory devices.

