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Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL

Jesus Cantu-Valle1, Francisco Ruiz-Zepeda1, Fernando Mendoza-Santoyo1

  • 1Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA.

Ultramicroscopy
|July 14, 2014
PubMed

Keywords:
Dual-lens imagingElectron holographyElectron opticsMetallic nanoparticlesPhase reconstruction

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