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Updated: Apr 27, 2026

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A Multimodal Wide-Field Fourier-Transform Raman Microscope
Published on: December 30, 2025
856
Raman-in-SEM, a multimodal and multiscale analytical tool: performance for materials and expertise
Guillaume Wille1, Xavier Bourrat1, Nicolas Maubec1
1BRGM, 3 Avenue Claude Guillemin - BP 36009, 45060 ORLEANS Cedex 2, France.
Summary
Integrating Raman spectroscopy with scanning electron microscopy (SEM) enables comprehensive material analysis. This study validates the SEMSCA interface for multimodal characterization, overcoming SEM-related artifacts for enhanced insights.
Area of Science:
- Materials Science
- Analytical Chemistry
- Geosciences
Background:
- Conventional analytical techniques require sample transfer between instruments, limiting efficiency.
- Integrating Raman spectroscopy within a scanning electron microscope (SEM) offers simultaneous morphological, elemental, and chemical analysis.
- The SEMSCA commercial Raman interface provides a novel solution for in-situ multimodal characterization.
Purpose of the Study:
- To document the metrological performance of the SEMSCA Raman interface in a low vacuum SEM.
- To evaluate multiscale and multimodal analyses, including Raman/EDS, Raman/cathodoluminescence, and Raman/STEM.
- To investigate and mitigate SEM-related artifacts affecting Raman spectra, particularly in geological samples.
Main Methods:
- Operation of the SEMSCA Raman interface within a low vacuum SEM.
- Comparison with a conventional micro-Raman spectrometer.
- Implementation of multimodal analyses (Raman/EDS, Raman/CL, Raman/STEM) and nanomaterial characterization.
- Methodology for overcoming electron beam-induced contamination and cathodoluminescence interference, including SEM beam shutter use.
Main Results:
- The SEMSCA interface demonstrates effective multiscale and multimodal analytical capabilities.
- Artifacts such as electron beam-induced contamination and cathodoluminescence contributions were identified and addressed.
- Optimized SEM and Raman settings, including a SEM beam shutter, successfully mitigated adverse effects.
- The interface allows for simultaneous acquisition of Raman and cathodoluminescence spectra.
Conclusions:
- The SEMSCA Raman interface offers efficient and powerful multimodal characterization directly within a SEM.
- This integrated approach simplifies analysis and enhances insights, particularly for geosciences applications.
- The ability to overcome SEM-related artifacts makes this a valuable tool for advanced materials analysis.
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