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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Apr 25, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

Adhesion Force Measurements Using an Atomic Force Microscope Upgraded with a Linear Position Sensitive Detector.

M Pierce¹, J Stuart¹, A Pungor¹

¹Department of Bioengineering, University of Utah, Salt Lake City, Utah 84112.

Langmuir : the ACS Journal of Surfaces and Colloids

|August 16, 2014

Summary

This summary is machine-generated.

Atomic force microscopy (AFM) can map surface energy and identify proteins. Upgrades enhance adhesion force measurement, improving sensitivity and accuracy for surface analysis.

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Area of Science:

Surface science
Biophysics
Nanotechnology

Background:

Atomic Force Microscopy (AFM) provides atomic-scale imaging.
AFM can measure forces between surfaces and the probe.
Mapping adhesive forces has applications in surface energy determination and protein identification.

Purpose of the Study:

To enhance the capabilities of AFM for measuring adhesion forces.
To improve the dynamic range, sensitivity, and linearity of AFM force measurements.
To overcome limitations associated with repetitive probe-specimen contacts.

Main Methods:

Replacing the standard four-quadrant photodiode sensor with an external linear position sensitive detector.
Implementing a dedicated user-programmable signal generator and acquisition system.
Utilizing the upgraded AFM system to measure adhesion forces.

Main Results:

The upgraded AFM system demonstrated a larger dynamic range for adhesion force measurements.
Improved sensitivity and linearity in force measurements were achieved.
Problems related to multiple repetitive contacts between the AFM probe and specimen surface were eliminated.

Conclusions:

The AFM upgrade significantly enhances its utility for quantitative surface force measurements.
The improved system facilitates precise spatial determination of surface energy and protein identification.
This advancement broadens the application scope of AFM in surface science and biophysics.