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Updated: Apr 25, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in

C Kisielowski1, P Specht2, S M Gygax2

  • 1National Center for Electron Microscopy and Joint Center for Artificial Photosynthesis, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, CA 94720, USA.

Micron (Oxford, England : 1993)
|August 26, 2014
PubMed

Keywords:
Aberration-correctionCatalysisFunctionalityLow dose imagingSingle atom sensitivityTEM

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