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Phase Contrast and Differential Interference Contrast Microscopy01:26

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In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
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Real-time phase shift interference microscopy.

Avner Safrani, Ibrahim Abdulhalim

    Optics Letters
    |August 29, 2014
    PubMed
    Summary

    A novel phase shift interference microscopy system achieves real-time 3D imaging at 50 volumes per second. This high-speed, high-accuracy method enables precise measurements for dynamic focusing, tilt, and surface roughness.

    Area of Science:

    • Optical microscopy
    • Metrology
    • Surface science

    Background:

    • Accurate and high-speed 3D surface characterization is crucial for advanced manufacturing and scientific research.
    • Existing microscopy techniques often face limitations in speed, accuracy, or both, hindering real-time analysis of dynamic processes.

    Purpose of the Study:

    • To develop and demonstrate a real-time phase shift interference microscopy system.
    • To achieve high-speed (50 volumes/sec) and high-accuracy (2 nm repeatability) 3D measurements.
    • To showcase the system's applicability in dynamic focusing, tilt measurement, roughness analysis, and 3D profiling.

    Main Methods:

    • Implementation of a polarization-based Linnik interferometer.
    • Utilization of three synchronized, phase-masked, parallel detectors for real-time data acquisition.

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  • Development of algorithms for phase retrieval and 3D reconstruction.

    • Main Results:

    • Demonstration of a real-time phase shift interference microscopy system operating at 50 volumes per second.
    • Achieved 2 nm height repeatability, indicating high measurement accuracy.
    • Successfully applied the system to dynamic focusing control, tilt measurement, submicrometer roughness measurement, and 3D profiling of fine structures.

    Conclusions:

    • The presented system offers a significant advancement in real-time, high-accuracy 3D metrology.
    • The demonstrated capabilities open new avenues for in-situ monitoring and analysis in various scientific and industrial fields.
    • This technology provides a robust platform for precise surface characterization at high speeds.