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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

$X-ray Diffraction of Biological Samples$ 01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...

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Updated: Apr 24, 2026

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Scanning force microscope for in situ nanofocused X-ray diffraction studies.

Zhe Ren¹, Francesca Mastropietro¹, Anton Davydok¹

¹IM2NP (UMR 7334), Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen - Case 142, F-13397 Marseille, France.

Journal of Synchrotron Radiation

|September 2, 2014

Summary

This summary is machine-generated.

A new instrument combines atomic force microscopy and X-ray diffraction for in situ nanomaterial analysis. This allows simultaneous imaging of topography and crystal structure, revealing mechanical behavior under deformation.

Keywords:

in situ atomic force microscopy mechanical properties nanofocused X-ray diffraction nanostructure

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$Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2$

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Published on: December 8, 2016

Area of Science:

Materials Science
Nanotechnology
Physics

Background:

Characterizing nanomaterials requires advanced techniques for imaging and structural analysis.
In situ studies are crucial for understanding dynamic processes and mechanical properties.

Purpose of the Study:

To develop and demonstrate a compact instrument for simultaneous in situ atomic force microscopy and nanofocused X-ray diffraction.
To investigate the mechanical behavior of gold nano-islands on a sapphire substrate.

Main Methods:

Integration of a compact scanning force microscope with nanofocused X-ray diffraction.
Simultaneous acquisition of atomic force microscope (AFM) images and scanning X-ray diffraction maps.
In situ mechanical deformation of nano-islands using an AFM tip.

Main Results:

Demonstrated capability on gold nano-islands on sapphire.
Simultaneous imaging of sample topography and crystallinity.
Monitoring of atomic lattice deformation during mechanical testing.

Conclusions:

The developed in situ device enables combined topographical and crystallographic analysis.
This approach provides insights into the mechanical properties of nanomaterials.
Facilitates in situ mechanical deformation studies at the nanoscale.