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Updated: Apr 24, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
A short-pulse X-ray beamline for spectroscopy and scattering
R Reininger1, E M Dufresne1, M Borland1
1Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA.
Picosecond X-ray spectroscopy facilities face optical design challenges. A new design minimizes off-axis radiation effects, enabling precise time-resolved studies in materials science.
Area of Science:
- Materials Science
- Chemical Physics
- Condensed Matter Physics
Background:
- Experimental facilities for picosecond X-ray spectroscopy and scattering utilize RF deflection of stored electron beams.
- These sources enable time-resolved diffraction, spectroscopy, and imaging studies in various scientific fields.
- Challenges exist in optical design for precise time resolution.
Purpose of the Study:
- To analyze optical design challenges in picosecond X-ray spectroscopy and scattering beamlines.
- To address the issue of off-axis radiation affecting X-ray pulse duration and time resolution.
- To present an optical design that minimizes these effects and allows variable pulse durations.
Main Methods:
- Detailed analysis of optical design for RF-deflected electron beams.
- Investigating the correlation between angle and time in undulator radiation.
- Simulating the impact of off-axis radiation on pulse duration for the SPXSS beamline.
Main Results:
- RF-deflected chirped electron beams produce undulator radiation with angle-time correlation.
- Off-axis radiation in concentric rings can compromise experimental time resolution.
- A novel optical design minimizes pulse duration lengthening due to off-axis radiation.
Conclusions:
- The proposed optical design effectively minimizes off-axis radiation effects.
- Variable X-ray pulse durations between 2.4 and 16 picoseconds are achievable.
- This advancement supports high-resolution time-resolved studies in materials science.
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