Plant identification through images: Using feature extraction of key points on leaf contours(1.)

Chih-Ying Gwo1, Chia-Hung Wei2

  • 1Department of Information Management, Chien Hsin University of Science and Technology, 229 Chien-Hsin Road, Taoyuan 320, Taiwan.

Summary

This study introduces a new leaf contour feature extraction method for plant identification. The method is highly accurate and invariant to scale and rotation, outperforming existing techniques.

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