A novel method for 3D crack edge extraction in CT volume data

Bi Bi1, Li Zeng2, Haina Jiang1

  • 1ICT Research Center, Key Laboratory of Optoelectronic Technology and System of the Education Ministry of China, Chongqing University, Chongqing, China College of Optoelectronic Engineering, Chongqing University, Chongqing, China.