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Chemistry-dependent X-ray-induced surface charging.

Bekir Salgın¹, Diego Pontoni, Dirk Vogel

¹Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Strasse 1, 40237 Duesseldorf, Germany. salgin@mpie.de.

Physical Chemistry Chemical Physics : PCCP

|September 16, 2014

Summary

This summary is machine-generated.

Synchrotron X-ray irradiation causes reversible surface charging, extending beyond the beam. This phenomenon depends on surface chemistry, substrate conductivity, and grounding, impacting interface science research.

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Area of Science:

Surface and interface science
Materials science
Synchrotron radiation applications

Background:

High-energy synchrotron radiation facilities advance materials and surface science.
While permanent radiation damage is well-studied, reversible irradiation-induced alterations require further in situ characterization.
Surface charging during irradiation is critical for interface science, especially involving solid-gas or solid-liquid interfaces.

Purpose of the Study:

To investigate reversible radiation-induced surface charging phenomena.
To understand the factors influencing the extent and characteristics of this charging.
To explore the implications for interface science investigations.

Main Methods:

Simultaneous in situ work function measurements using a scanning Kelvin probe.
Precise hard X-ray micro-beam irradiation using a synchrotron surface diffractometer.
Controlled experiments to assess surface chemistry, bulk conductivity, and grounding effects.

Main Results:

Demonstrated partially reversible radiation-induced surface charging.
Observed charging effects extending beyond the X-ray beam's spatial dimensions.
Found charging magnitude and sign to be dependent on surface chemistry, substrate conductivity, and grounding.

Conclusions:

Reversible surface charging during synchrotron irradiation is a significant phenomenon.
The interaction with ionized ambient molecules plays a key role in charge propagation.
Understanding these charging effects is crucial for accurate interpretation of interface science experiments conducted at synchrotron facilities.