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Updated: Apr 23, 2026

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries
Published on: April 22, 2013
Native point defects in CuIn(1-x)Ga(x)Se2: hybrid density functional calculations predict the origin of p- and n-type
J Bekaert1, R Saniz, B Partoens
1CMT-group and EMAT, Department of Physics, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium. Jonas.Bekaert@uantwerpen.be.
Abstract:
We have performed a first-principles study of the p- and n-type conductivity in CuIn(1-x)Ga(x)Se2 due to native point defects, based on the HSE06 hybrid functional. Band alignment shows that the band gap becomes larger with x due to the increasing conduction band minimum, rendering it hard to establish n-type conductivity in CuGaSe2. From the defect formation energies, we find that In/GaCu is a shallow donor, while V(Cu), V(In/Ga) and Cu(In/Ga) act as shallow acceptors. Using the total charge neutrality of ionized defects and intrinsic charge carriers to determine the Fermi level, we show that under In-rich growth conditions InCu causes strongly n-type conductivity in CuInSe2. Under increasingly In-poor growth conditions, the conductivity type in CuInSe2 alters to p-type and compensation of the acceptors by In(Cu) reduces, as also observed in photoluminescence experiments. In CuGaSe2, the native acceptors pin the Fermi level far away from the conduction band minimum, thus inhibiting n-type conductivity. On the other hand, CuGaSe2 shows strong p-type conductivity under a wide range of Ga-poor growth conditions. Maximal p-type conductivity in CuIn(1-x)Ga(x)Se2 is reached under In/Ga-poor growth conditions, in agreement with charge concentration measurements on samples with In/Ga-poor stoichiometry, and is primarily due to the dominant acceptor Cu(In/Ga).
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