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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Apr 23, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Mechanically stable tuning fork sensor with high quality factor for the atomic force microscope.

Kwangyoon Kim¹, Jun-Young Park, K B Kim

¹Faculty of Nanotechnology and Advanced Material Engineering, HMC, and GRI, Sejong University, Seoul, Korea.

|September 18, 2014

Summary

This summary is machine-generated.

This study introduces a quartz tuning fork as a stable force sensor for atomic force microscopy (AFM). This novel sensor achieves image quality comparable to traditional cantilever-based AFM systems.

Keywords:

atomic force microscope (AFM)quartz tuning fork scanning probe microscopy (SPM)tuning fork sensor

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Area of Science:

Materials Science
Nanotechnology
Physics

Background:

Atomic Force Microscopy (AFM) traditionally uses cantilevers as force sensors.
Cantilevers can be fragile and susceptible to environmental factors.
Improving sensor stability and quality factor is crucial for high-resolution AFM imaging.

Purpose of the Study:

To explore the use of a quartz tuning fork as an alternative force sensor in AFM.
To evaluate the performance and image quality of a tuning fork-based AFM sensor.
To enhance mechanical stability for improved sensor performance.

Main Methods:

A quartz tuning fork was modified to serve as the force sensor.
A sharp tungsten tip was fabricated via electrochemical etching and attached to the tuning fork.
The tuning fork was mounted on an alumina plate for mechanical stability.
Phase shift was utilized as the feedback signal, maintaining constant amplitude with a lock-in amplifier and automatic gain controller.

Main Results:

The tuning fork-based sensor demonstrated high mechanical stability.
A high quality factor (approximately 10^3) was achieved due to enhanced stability.
AFM imaging using the tuning fork sensor yielded results equivalent to cantilever-based systems.

Conclusions:

Quartz tuning forks offer a viable and stable alternative to traditional cantilevers for AFM force sensing.
The developed tuning fork sensor provides high image quality comparable to existing AFM technologies.
This approach enhances sensor stability, leading to robust AFM performance.