Differential Leveling
Adjusting a Traverse
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Apr 23, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Shijie Zhao1, Yan Li1, Enyao Zhang1
1The State Key Lab of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China.
This study introduces a novel tilt angle measurement system with high resolution and stability. It significantly reduces noise using a two-step amplification process with MEMS inclinometers.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: