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Updated: Apr 23, 2026

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
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Elemental fingerprinting of materials with sensitivity at the atomic limit

Nozomi Shirato1, Marvin Cummings, Heath Kersell

  • 1Advanced Photon Source, Argonne National Laboratory , 9700 South Cass Ave, Argonne, Illinois 60439, United States.

Nano Letters
|October 3, 2014
PubMed

Keywords:
X-ray microscopychemical imagingscanning tunneling microscopysmart tipssynchrotron

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