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Published on: December 2, 2022
Dynamic modeling and simulation of rough cylindrical micro/nanoparticle manipulation with atomic force microscopy.
Moharam H Korayem1, Hedieh Badkoobeh Hezaveh1, Moein Taheri1
1Robotic Research Laboratory,Center of Excellence in Experimental Solid Mechanics and Dynamics,School of Mechanical Engineering,Iran University of Science and Technology,PO Box 18846,Tehran,Iran.
Pushing rough micro/nanoparticles with an atomic force microscope (AFM) probe is simulated. Rough particles require less critical force and time for manipulation compared to smooth ones, with specific roughness parameters influencing these outcomes.
Area of Science:
- Surface science and nanotechnology
- Atomic force microscopy (AFM) applications
- Particle manipulation mechanics
Background:
- Investigating the manipulation of micro/nanoparticles is crucial for various nanoscale applications.
- Understanding the contact mechanics and adhesion forces is fundamental for precise particle handling.
- Atomic force microscopy (AFM) offers a unique tool for probing interactions at the nanoscale.
Purpose of the Study:
- To investigate the dynamics of pushing rough cylindrical micro/nanoparticles using an AFM probe.
- To develop and simulate a dynamic model for particle manipulation considering surface roughness.
- To compare the manipulation of rough particles with smooth particles and analyze the effect of roughness parameters.
Main Methods:
- Studied contact mechanics and adhesion forces relevant to particle-surface interactions.
- Developed a method to estimate the real area of contact for rough cylindrical particles.
- Simulated the pushing process using a dynamic model for various particle sizes and roughness dimensions.
Main Results:
- Rough cylindrical particles require less critical force and time for manipulation compared to smooth particles.
- Reduced aspect ratio and asperity radius (Rabinovich model) increased the critical force and time for manipulation.
- Simulation results for reduced cylindrical particles approximated conditions for smooth spherical particles on rough substrates.
Conclusions:
- Surface roughness significantly influences the critical force and time required for micro/nanoparticle manipulation.
- The developed dynamic model provides insights into the mechanics of pushing rough particles with an AFM.
- Findings contribute to optimizing nanoscale manipulation strategies for rough particles.
