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Field Effect Transistor
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Hoon Ryu1, Sunhee Lee, Martin Fuechsle
1National Institute of Supercomputing and Networking, Korea Institute of Science and Technology Information, Daejeon, 305-806, Republic of Korea; Network for Computational Nanotechnology, Purdue University, Indiana, 47907, USA.
This study models single-atom transistors, revealing how atom placement impacts device properties. Precise atom positioning is crucial for controlling charging energy and enabling advanced information processing.
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