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Atomic Emission Spectroscopy: Overview01:20

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Development and characterization of a portable total reflection X-ray fluorescence system using a waveguide for trace

Ana Cristina M da Costa1, Ubiratan B de Araújo, Edgar F O de Jesus

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Summary

This study introduces a portable total reflection X-ray fluorescence (TXRF) system. The compact, low-cost TXRF instrument achieves excellent detection limits for multiple elements.

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Area of Science:

  • Analytical Chemistry
  • Atomic Spectroscopy
  • Materials Science

Background:

  • X-ray fluorescence (XRF) is a powerful elemental analysis technique.
  • Traditional XRF systems can be large, expensive, and require significant power.
  • There is a need for portable, cost-effective XRF instrumentation.

Purpose of the Study:

  • To develop and characterize a portable total reflection X-ray fluorescence (TXRF) system.
  • To evaluate the performance and accuracy of the developed TXRF system.
  • To demonstrate the feasibility of using low-power components for TXRF analysis.

Main Methods:

  • A portable TXRF system was constructed using a 15 W X-ray tube, a waveguide, a Si PIN detector, and a quartz optical flat.
  • The critical angle of total reflection was determined using a zinc solution.
  • System accuracy was validated using NIST SRM 1577b Bovine Liver standard reference material.

Main Results:

  • The system achieved absolute detection limits for P (450 ± 40 ng), S (200 ± 31 ng), K (30 ± 2.5 ng), Ca (19 ± 3.5 ng), Mn (4.1 ± 0.5 ng), Fe (3.6 ± 0.9 ng), Cu (3.3 ± 0.4 ng), and Zn (3.5 ± 0.3 ng).
  • Experimental determination of the critical angle for total reflection was successful.
  • Validation with a standard reference material confirmed the system's accuracy.

Conclusions:

  • A compact, efficient, and low-cost portable TXRF system was successfully developed.
  • The system utilizes a low-power X-ray tube and a Si PIN detector, making it easy to handle.
  • This demonstrates the potential for accessible TXRF analysis in various settings.