Dispersion characterization of two orthogonal modes in a birefringence tellurite microstructured optical fiber

An elliptical core tellurite microstructured optical fiber with high birefringence was demonstrated and the chromatic dispersion of the two orthogonal modes in this fiber was experimentally characterized by a white light spectral interferometric technique over a wide spectral range. A series of spectral interferograms as a function of the optical path difference were recorded in the Mach-Zehnder interferometer. The birefringence dependence of the wavelength in the fiber was determined by interferograms. The measured and calculated dispersion matched well within the whole spectrum range under test.