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Absolute measurement of hyperspectral and angular reflection.

Jisoo Hwang

    Applied Optics
    |October 17, 2014
    PubMed
    Summary
    This summary is machine-generated.

    A novel instrument precisely measures hyperspectral and angular reflection from 380-780 nm. This advanced system achieves low measurement uncertainty, crucial for accurate material characterization.

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    Area of Science:

    • Optical physics
    • Metrology
    • Materials science

    Background:

    • Accurate measurement of spectral and angular reflection is vital for material characterization.
    • Existing methods may have limitations in precision and scope.
    • Development of advanced instrumentation is needed for improved optical property determination.

    Purpose of the Study:

    • To present a new instrument for absolute measurement of hyperspectral and angular reflection.
    • To characterize the instrument's performance and uncertainty.
    • To compare results with established measurement techniques.

    Main Methods:

    • Utilized a white light source and a CCD-based spectroradiometer for measurements.
    • Operated within a wavelength range of 380 to 780 nm with 3 nm spectral resolution.
    • Performed uncertainty evaluation for diffuse materials like Spectralon.

    Main Results:

    • The instrument determines absolute angular reflection quantities with high precision.
    • Measurement uncertainty was evaluated to be 1.4%-2.9% (k=2) for Spectralon.
    • Comparison with integrating-sphere measurements showed agreement in uncertainties for hemispherical reflectance.

    Conclusions:

    • The developed instrument provides accurate absolute measurements of hyperspectral and angular reflection.
    • The low uncertainty demonstrates the instrument's reliability for scientific applications.
    • The findings validate the instrument's capability for precise optical property analysis.