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Postfabrication annealing effects on insulator-metal transitions in VO2 thin-film devices

Servin Rathi1, In-yeal Lee, Jin-Hyung Park

  • 1School of Electronic and Electrical Engineering and Sungkyunkwan Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University , Suwon 440-746, Korea.

ACS Applied Materials & Interfaces
|October 25, 2014
PubMed

Keywords:
annealingmetal−insulator transitiontransmission line methodvanadium dioxide thin-films

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