Origin of leakage paths driven by electric fields in Al-doped TiO2 films

Gyeong-Su Park1, Seong Yong Park, Sung Heo

  • 1Samsung Advanced Institute of Technology, San 14-1, Nongseo-Ri, Kiheung-Eub, Yongin-Si, Kyeonggi-Do, 446-712, South Korea.

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