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Updated: Apr 21, 2026

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
Published on: June 30, 2023
Sangmin An1, Santiago D Solares, Sergio Santos
1Center for Nanoscale Science and Technology, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA. Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA.
Multimodal atomic force microscopy (AFM) uses multiple cantilever vibrations simultaneously. This technique reveals hidden sample properties and provides enhanced contrast by analyzing energy transfer between eigenmodes.
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