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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Apr 21, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

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Published on: October 24, 2014

Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air.

Santiago D Solares¹, Sangmin An², Christian J Long²

¹Department of Mechanical Engineering, University of Maryland, College Park, Maryland 20742, United States; current address: Department of Mechanical and Aerospace Engineering, George Washington University, Washington, DC 20052, United States ; Maryland NanoCenter, University of Maryland, College Park, Maryland 20742, United States.

Beilstein Journal of Nanotechnology

|November 11, 2014

Summary

This summary is machine-generated.

This study explores multimodal atomic force microscopy (AFM) using more than three cantilever eigenmodes. Findings show potential for advanced multi-frequency AFM with increased versatility and sophistication.

Keywords:

amplitude-modulation bimodal frequency-modulation multi-frequency atomic force microscopy multimodal open loop trimodal

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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Area of Science:

Surface science
Nanotechnology
Materials science

Background:

Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging.
Multi-frequency AFM enhances resolution and information extraction by utilizing multiple cantilever eigenmodes.
Exploring higher-order eigenmodes can unlock new imaging capabilities.

Purpose of the Study:

To investigate multimodal tapping-mode AFM with more than three driven cantilever eigenmodes.
To explore the dynamics and spectroscopy of tetramodal (4-eigenmode) and pentamodal (5-eigenmode) AFM.
To assess the potential for increased sophistication and versatility in multi-frequency AFM.

Main Methods:

Experimental tetramodal (4-eigenmode) imaging of a polytetrafluoroethylene (PTFE) film.
Computational simulations of pentamodal (5-eigenmode) cantilever dynamics and spectroscopy.
Analysis of tip response in time and frequency domains, focusing on large amplitude ratios.

Main Results:

Demonstration of tetramodal imaging experiments.
Simulation of pentamodal cantilever dynamics and spectroscopy.
Discussion of complex tip responses and average amplitude/phase characteristics.
Illustration of typical images and spectroscopy curves with contrast descriptions.

Conclusions:

Multimodal AFM with a higher number of driven eigenmodes offers increased sophistication and versatility.
The study highlights opportunities for future research in advanced multi-frequency AFM.
Findings pave the way for more complex and informative nanoscale investigations.