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Updated: Apr 21, 2026

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
Published on: March 12, 2017
Phase reconstruction in annular bright-field scanning transmission electron microscopy
Takafumi Ishida1, Tadahiro Kawasaki2, Takayoshi Tanji3
1Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603, Japan Global Research Center for Environment and Energy Based on Nanomaterials Science, Furo-cho, Chikusa, Nagoya 464-8502, Japan takafu_i@nuee.nagoya-u.ac.jp.
Abstract:
A novel technique for reconstructing the phase shifts of electron waves was applied to Cs-corrected scanning transmission electron microscopy (STEM). To realize this method, a new STEM system equipped with an annular aperture, annularly arrayed detectors and an arrayed image processor has been developed and evaluated in experiments. We show a reconstructed phase image of graphite particles and demonstrate that this new method works effectively for high-resolution phase imaging.
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