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High-NA fiber point-diffraction interferometer for three-dimensional coordinate measurement.

Daodang Wang, Xixi Chen, Yangbo Xu

    Optics Express
    |November 18, 2014
    PubMed
    Summary
    This summary is machine-generated.

    A novel fiber point-diffraction interferometer (PDI) enhances measurement range using a high numerical aperture (NA) and power diffraction wave. This system achieves precise absolute 3D coordinate measurements with excellent repeatability.

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    Area of Science:

    • Optics and Photonics
    • Interferometry
    • Metrology

    Background:

    • Point-diffraction interferometers (PDIs) face limitations in measurement range due to numerical aperture (NA) and diffraction wave power.
    • Extending the measurement range of PDIs is crucial for advanced metrology applications.

    Purpose of the Study:

    • To propose and validate a fiber point-diffraction interferometer (PDI) with a high numerical aperture (NA) for enhanced absolute three-dimensional coordinate measurement.
    • To overcome the limitations of conventional PDIs by increasing the NA and power of the diffraction wave.

    Main Methods:

    • Utilizing a single-mode fiber with a submicron aperture to generate a high NA and high-power diffraction wave.
    • Implementing a double-iterative method based on the Levenberg-Marquardt algorithm for 3D coordinate determination.
    • Conducting numerical simulations and experimental comparisons to assess system performance.

    Main Results:

    • The proposed fiber PDI successfully generated a high NA and high-power diffraction wave, extending the achievable measurement range.
    • The double-iterative algorithm accurately determined absolute 3D coordinates.
    • Experimental results demonstrated high measurement precision and excellent repeatability.

    Conclusions:

    • The fiber PDI system effectively overcomes the range limitations of conventional PDIs.
    • The proposed method offers a feasible and high-precision solution for absolute 3D coordinate measurements.
    • This advancement has significant implications for metrology and precision engineering.