Refractive index and geometrical thickness measurement of thin optical samples by a transmitted Gaussian beam

We describe a technique for simultaneously measuring the local geometrical thickness and the refractive index of semi-transparent thin plates by means of the diffractive properties of a transmitted Gaussian beam. The technique is based on measuring the semi-width of the transmitted beam and the shift of the Gaussian centroid caused by introducing a tilt on the sample under test. A homodyne technique is devised to accurately characterize the Gaussian beam. Our proposal does not require any prior information of the sample under study. We present analytical support of our technique and we give experimental results.