Electron microscopy of quantum dots
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Updated: Apr 20, 2026

Correlative Light- and Electron Microscopy Using Quantum Dot Nanoparticles
Published on: August 7, 2016
1Department of Electronic & Electrical Engineering, University of Sheffield, Sheffield, S1 3JD, U.K.
Abstract:
This brief review describes the different types of semiconductor quantum dot systems, their main applications and which types of microscopy methods are used to characterize them. Emphasis is put on the need for a comprehensive investigation of their size distribution, microstructure, chemical composition, strain state and electronic properties, all of which influence the optical properties and can be measured by different types of imaging, diffraction and spectroscopy methods in an electron microscope.
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