x-ray irradiation analysis based on wavelet transform in tokamak plasma
Related Experiment Video
Updated: Apr 20, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
K Ghanbari1, M Ghoranneviss1, A Salar Elahi1
1Plasma Physics Research Center, Science and Research Branch, Islamic Azad University, Tehran, Iran.
Abstract:
Hard x-ray emission from the Runaway electrons is an important issue in tokamaks. Suggesting methods to reduce the Runaway electrons and therefore the emitted hard x-ray is important for tokamak plasma operation. In this manuscript, we have investigated the effects of external fields on hard x-ray intensity and Magneto-Hydro-Dynamic (MHD) activity. In other words, we have presented the effects of positive biased limiter and Resonant Helical Field (RHF) on the MHD fluctuations and hard x-ray emission from the Runaway electrons. MHD activity and hard x-ray intensity were analyzed using Wavelet transform in the presence of external fields and without them. The results show that the MHD activity and therefore the hard x-ray intensity can be controlled by the external electric and magnetic fields.
Related Concept Videos
Atomic Emission Spectroscopy: Lab
Atomic Emission Spectroscopy: Overview
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
Atomic Emission Spectroscopy: Instrumentation

