Metal-Semiconductor Junctions
Semiconductors
Types of Semiconductors
Imperfections in Crystal Structure: Stoichiometric Point Defects
Biasing of Metal-Semiconductor Junctions
Imperfections in Crystal Structure: Point, Line and Plane Defects
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Debdeep Jena1, Kaustav Banerjee2, Grace Huili Xing1
1Department of Electrical Engineering, University of Notre Dame, Indiana 46556, USA, and in the Department of Electrical and Computer Engineering, and Department of Materials Science &Engineering, Cornell University, New York 14853, USA.
No abstract available in PubMed .