Related Experiment Video
Updated: Apr 20, 2026

Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
Published on: June 23, 2023
Image plate characterization and absolute calibration to low kilo-electron-volt electrons
S Busold1, K Philipp2, A Otten2
1GSI Helmholtzzentrum für Schwerionenforschung, Planckstraße 1, 64291 Darmstadt, Germany.
Abstract:
We report on the characterization of an image plate and its absolute calibration to electrons in the low keV energy range (1-30 keV). In our case, an Agfa MD4.0 without protection layer was used in combination with a Fuji FLA7000 scanner. The calibration data are compared to other published data and a consistent picture of the sensitivity of image plates to electrons is obtained, which suggests a validity of the obtained calibration up to 100 keV.
Related Concept Videos
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Electron Behavior
Electrons are negatively charged subatomic particles that are attracted to an orbit around the positively-charged nucleus of an atom. They reside in locations that are associated with energy levels called shells and are further organized into sub-shells and orbitals within each shell.
Electrons Orbit the Nucleus
Electrons are found in specific locations outside of the nucleus. The shell in which an electron resides indicates the general energy level of the electron: those closer to the...
Transmission Electron Microscopy
Atomic Emission Spectroscopy: Lab
Thomson's e/m Experiment
A particle with charge q, speed v, and mass m enters an area from the top, where the magnetic and electric fields are perpendicular both to the particle's motion and to one another. The magnetic...

